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https://repositorio.ufba.br/handle/ri/13234
metadata.dc.type: | Artigo de Periódico |
Título : | Ion trajectories in atom probe field ion microscopy and gas field ion sources |
Otros títulos : | Journal of Physics D: Applied Physics |
Autor : | Castilho, Caio Mário Castro de |
metadata.dc.creator: | Castilho, Caio Mário Castro de |
Resumen : | Trajectories of positive ions produced in a region close to a structured surface, modelled by spherical or spheroidal protrusions and kept at a positive electric potential with respect to a distant screen or detector are calculated. The results are discussed in comparison with similar practical situations produced by field ionization and field evaporation or desorption, such as those occurring in gas field ion sources, field ion microscopy and field desorption spectroscopy. |
Editorial : | Journal of Physics D: Applied Physics |
URI : | http://www.repositorio.ufba.br/ri/handle/ri/13234 |
Fecha de publicación : | 1999 |
Aparece en las colecciones: | Artigo Publicado em Periódico (FIS) |
Ficheros en este ítem:
Fichero | Descripción | Tamaño | Formato | |
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44444444444444.pdf | 112,83 kB | Adobe PDF | Visualizar/Abrir |
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