Ion trajectories in atom probe field ion microscopy and gas field ion sources

Use este identificador para citar ou linkar para este item: https://repositorio.ufba.br/handle/ri/13234

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Campo DC	Valor	Idioma
dc.contributor.author	Castilho, Caio Mário Castro de	-
dc.creator	Castilho, Caio Mário Castro de	-
dc.date.accessioned	2013-10-15T15:20:04Z	-
dc.date.available	2013-10-15T15:20:04Z	-
dc.date.issued	1999	-
dc.identifier.issn	0022-3727	-
dc.identifier.uri	http://www.repositorio.ufba.br/ri/handle/ri/13234	-
dc.description	Texto completo. Acesso restrito. p. 2261–2265	pt_BR
dc.description.abstract	Trajectories of positive ions produced in a region close to a structured surface, modelled by spherical or spheroidal protrusions and kept at a positive electric potential with respect to a distant screen or detector are calculated. The results are discussed in comparison with similar practical situations produced by field ionization and field evaporation or desorption, such as those occurring in gas field ion sources, field ion microscopy and field desorption spectroscopy.	pt_BR
dc.language.iso	en	pt_BR
dc.publisher	Journal of Physics D: Applied Physics	pt_BR
dc.source	10.1088/0022-3727/32/17/317	pt_BR
dc.title	Ion trajectories in atom probe field ion microscopy and gas field ion sources	pt_BR
dc.title.alternative	Journal of Physics D: Applied Physics	pt_BR
dc.type	Artigo de Periódico	pt_BR
dc.description.localpub	Salvador	pt_BR
dc.identifier.number	v. 32, n. 17	pt_BR
Aparece nas coleções:	Artigo Publicado em Periódico (FIS)

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